Jiang, R.; Xiong, K.; Zhang, Y.; Zhou, L.; Liu, T.; Zhong, Z.
Outage and Throughput of WPCN-SWIPT Networks with Nonlinear EH Model in Nakagami-m Fading. Electronics 2019, 8, 138.
https://doi.org/10.3390/electronics8020138
AMA Style
Jiang R, Xiong K, Zhang Y, Zhou L, Liu T, Zhong Z.
Outage and Throughput of WPCN-SWIPT Networks with Nonlinear EH Model in Nakagami-m Fading. Electronics. 2019; 8(2):138.
https://doi.org/10.3390/electronics8020138
Chicago/Turabian Style
Jiang, Ruihong, Ke Xiong, Yu Zhang, Li Zhou, Tong Liu, and Zhangdui Zhong.
2019. "Outage and Throughput of WPCN-SWIPT Networks with Nonlinear EH Model in Nakagami-m Fading" Electronics 8, no. 2: 138.
https://doi.org/10.3390/electronics8020138
APA Style
Jiang, R., Xiong, K., Zhang, Y., Zhou, L., Liu, T., & Zhong, Z.
(2019). Outage and Throughput of WPCN-SWIPT Networks with Nonlinear EH Model in Nakagami-m Fading. Electronics, 8(2), 138.
https://doi.org/10.3390/electronics8020138