Performance Degradation of Nanofilament Switching Due to Joule Heat Dissipation
Round 1
Reviewer 1 Report
The topic is interesting but the paper has serious issues such as.
The paper does not appear to be a material paper.
The layout is confusing, The abstract is very brief, no key results are included.
No headings or sections.
Figure 1 reference in the caption is missing.
A strong introduction should be included with a literature review and motivation to the work. The paper appeared as if with no introduction.
Methodology about the measurement of the results is missing.
References are limited. if an introduction is added it will allow the investigation of other papers in the field.
Author Response
The authors would like to thank the 1st reviewer for his valuable comments that help improve the manuscript. The 1st reviewer’s comments and suggestions have been followed and result in a substantially expanded manuscript of about one third. The paper has been expanded, rewritten, and restructured. The structure is now reflected in the new sections with the following headings:
Introduction Device Fabrication and Electrical Characterization Methodology Thermal Cell-to-Cell Cross Talk Effects in ReRAM Arrays
3.1 Definition of a “Marginal” Device as a Probe into Cross-Talk Effects
3.2 Dissipation and Transport of Joule’s Heat in ReRAM Arrays
3.3 Degradation of Electric Performance of Cells sharing the Pt Electrode
3.4 Degradation of Electric Performance of Cells sharing the Pt Electrode
3.5 Degradation of Electric Performance of Cells with no Common Electrodes with the Heated Cell
3.6 Inference of the Nanofilament Shape
Analysis and Implications for high-pitch Nanometer-sized Commercial Arrays Conclusions
Our response is preceded by the letter R and is highlighted in blue color.
The topic is interesting but the paper has serious issues such as.
The paper does not appear to be a material paper.
The layout is confusing, The abstract is very brief, no key results are included.
The paper has been expanded, rewritten, and restructured. The structure is now reflected in the new sections with the following headings:
Introduction Device Fabrication and Electrical Characterization Methodology Thermal Cell-to-Cell Cross Talk Effects in ReRAM Arrays Definition of a “Marginal” Device as a Probe into Cross-Talk Effects Dissipation and Transport of Joule’s Heat in ReRAM Arrays Degradation of Electric Performance of Cells sharing the Pt Electrode Degradation of Electric Performance of Cells sharing the Pt Electrode Degradation of Electric Performance of Cells with no Common Electrodes with the Heated Cell Inference of the Nanofilament Shape Analysis and Implications for high-pitch Nanometer-sized Commercial Arrays Conclusions
The abstract has been now rewritten to summarize the main results of the paper.
No headings or sections.
The headings have been introduced as indicated above.
Figure 1 reference in the caption is missing.
This has been corrected and the Figure 1 has been split in two Figures with two Figure captions. The Figure 2 shown now the I-V characteristics on a log scale. Figure 1 shows now also the cross-section of the device.
A strong introduction should be included with a literature review and motivation to the work. The paper appeared as if with no introduction.
Additional text of more than one page has been added as an introduction in which the relevant literature on thermal effects in ReRAM arrays is being discussed. Accordingly 19 literature references have been added.
Methodology about the measurement of the results is missing.
The methodology of the measurement of experimental results has been added in the second section and also expanded in the main result section, number 3.
References are limited. if an introduction is added it will allow the investigation of other papers in the field.
19 new relevant references have been added in the revised manuscript.
Author Response File: 
Author Response.pdf
Reviewer 2 Report
This is a well-written description of an interesting investigation concerning a serious issue in application of memory crossbar array. But it is not written in a traditional format of Research Article. It is missing the required sections titled similar as "Introduction", "Material", "Experiment", Result", "Analysis", "Conclusion", "Acknowledgement" etc.
Please re-write the manuscript following the guidelines for the author given in
https://www.mdpi.com/journal/materials/instructions#preparation
Author Response
The authors would like to thank the 2nd reviewer for his valuable comments that help improve the manuscript. The 2nd reviewer’s comments and suggestions have been followed and result in a substantially expanded manuscript of about one third. The paper has been expanded, rewritten, and restructured. The structure is now reflected in the new sections with the following headings:
Introduction Device Fabrication and Electrical Characterization Methodology Thermal Cell-to-Cell Cross Talk Effects in ReRAM Arrays
3.1 Definition of a “Marginal” Device as a Probe into Cross-Talk Effects
3.2 Dissipation and Transport of Joule’s Heat in ReRAM Arrays
3.3 Degradation of Electric Performance of Cells sharing the Pt Electrode
3.4 Degradation of Electric Performance of Cells sharing the Pt Electrode
3.5 Degradation of Electric Performance of Cells with no Common Electrodes with the Heated Cell
3.6 Inference of the Nanofilament Shape
Analysis and Implications for high-pitch Nanometer-sized Commercial Arrays Conclusions
Our response is preceded by the letter R and is highlighted in blue color.
This is a well-written description of an interesting investigation concerning a serious issue in application of memory crossbar array. But it is not written in a traditional format of Research Article. It is missing the required sections titled similar as "Introduction", "Material", "Experiment", Result", "Analysis", "Conclusion", "Acknowledgement" etc.
Please re-write the manuscript following the guidelines for the author given in
https://www.mdpi.com/journal/materials/instructions#preparation
The paper has been expanded, rewritten, and restructured. The structure is now reflected in the new sections with the following headings:
Introduction Device Fabrication and Electrical Characterization Methodology Thermal Cell-to-Cell Cross Talk Effects in ReRAM Arrays Definition of a “Marginal” Device as a Probe into Cross-Talk Effects Dissipation and Transport of Joule’s Heat in ReRAM Arrays Degradation of Electric Performance of Cells sharing the Pt Electrode Degradation of Electric Performance of Cells sharing the Pt Electrode Degradation of Electric Performance of Cells with no Common Electrodes with the Heated Cell Inference of the Nanofilament Shape Analysis and Implications for high-pitch Nanometer-sized Commercial Arrays Conclusions
The abstract has been now rewritten to summarize the main results of the paper.
Figure 1 has been split in two Figures with two Figure captions. The Figure 2 shown now the I-V characteristics on a log scale. Figure 1 shows now also the cross-section of the device.
Additional text of more than one page has been added as an introduction in which the relevant literature on thermal effects in ReRAM arrays is being discussed. Accordingly 19 literature references have been added.
The methodology of the measurement of experimental results is now described in more detail in the 2nd section and also expanded in the 3rd section, which discussed the main results of the paper.
Author Response File: Author Response.pdf
Round 2
Reviewer 2 Report
The article after the modification as per the recommendation turns suitable for publication and can attract readers' attention.
Comments:
Missing acknowledgment Section: Please acknowledge any support from the funding source for executing the research.
