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Journal: Electronics, 2020
Volume: 9
Number: 1652
Article:
Numerical Study of Sub-Gap Density of States Dependent Electrical Characteristics in Amorphous In-Ga-Zn-O Thin-Film Transistors
Authors:
by
Do-Kyung Kim, Jihwan Park, Xue Zhang, Jaehoon Park and Jin-Hyuk Bae
Link:
https://www.mdpi.com/2079-9292/9/10/1652
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