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Journal: Electronics, 2020
Volume: 9
Number: 1875

Article: Effects of Annealing Atmosphere on Electrical Performance and Stability of High-Mobility Indium-Gallium-Tin Oxide Thin-Film Transistors
Authors: by Hwan-Seok Jeong, Hyun Seok Cha, Seong Hyun Hwang and Hyuck-In Kwon
Link: https://www.mdpi.com/2079-9292/9/11/1875

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