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Journal: Electronics, 2020
Volume: 9
Number: 2095
Article:
Hot Carrier Stress Sensing Bulk Current for 28 nm Stacked High-k nMOSFETs
Authors:
by
Chii-Wen Chen, Mu-Chun Wang, Cheng-Hsun-Tony Chang, Wei-Lun Chu, Shun-Ping Sung and Wen-How Lan
Link:
https://www.mdpi.com/2079-9292/9/12/2095
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