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Journal: PhotonicsVolume: 12Number: 861
Article: In Situ OBIC Mapping to Investigate Native Defect Dynamics in GaInN/GaN-Based Light-Emitting Diodes
- Authors:
- Dong-Guang Zheng1,
- Jian-Feng Zhang1 and
- Hao-Min Yu1
- et al.
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