Longo, E.; Alj, D.; Batenburg, J.; de La Rochefoucauld, O.; Herzog, C.; Greving, I.; Li, Y.; Lyubomirskiy, M.; Falch, K.V.; Estrela, P.;
et al. Flexible Plenoptic X-ray Microscopy. Photonics 2022, 9, 98.
https://doi.org/10.3390/photonics9020098
AMA Style
Longo E, Alj D, Batenburg J, de La Rochefoucauld O, Herzog C, Greving I, Li Y, Lyubomirskiy M, Falch KV, Estrela P,
et al. Flexible Plenoptic X-ray Microscopy. Photonics. 2022; 9(2):98.
https://doi.org/10.3390/photonics9020098
Chicago/Turabian Style
Longo, Elena, Domenico Alj, Joost Batenburg, Ombeline de La Rochefoucauld, Charlotte Herzog, Imke Greving, Ying Li, Mikhail Lyubomirskiy, Ken Vidar Falch, Patricia Estrela,
and et al. 2022. "Flexible Plenoptic X-ray Microscopy" Photonics 9, no. 2: 98.
https://doi.org/10.3390/photonics9020098
APA Style
Longo, E., Alj, D., Batenburg, J., de La Rochefoucauld, O., Herzog, C., Greving, I., Li, Y., Lyubomirskiy, M., Falch, K. V., Estrela, P., Flenner, S., Viganò, N., Fajardo, M., & Zeitoun, P.
(2022). Flexible Plenoptic X-ray Microscopy. Photonics, 9(2), 98.
https://doi.org/10.3390/photonics9020098