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Journal: Electron. Mater., 2022
Volume: 3
Number: 11

Article: Majority and Minority Charge Carrier Traps in n-Type 4H-SiC Studied by Junction Spectroscopy Techniques
Authors: by Ivana Capan and Tomislav Brodar
Link: https://www.mdpi.com/2673-3978/3/1/11

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