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Journal: Electron. Mater., 2022
Volume: 3
Number: 11
Article:
Majority and Minority Charge Carrier Traps in n-Type 4H-SiC Studied by Junction Spectroscopy Techniques
Authors:
by
Ivana Capan and Tomislav Brodar
Link:
https://www.mdpi.com/2673-3978/3/1/11
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