Recent Advances and Applications of Machine Learning in Pattern Recognition
A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Computer Science & Engineering".
Deadline for manuscript submissions: 15 June 2025 | Viewed by 457
Special Issue Editors
Interests: pattern recognition; machine learning; image processing; biomedical applications
Special Issue Information
Dear Colleagues,
In recent years, pattern recognition has undergone remarkable development, driven above all by the use of machine learning techniques. These algorithms have been applied to various areas, such as medical image analysis, visual recognition, biometrics, remote sensing, communication, and even computer vision in autonomous vehicles, enabling the development of pattern recognition systems that have greater precision and efficiency. Recent approaches allow for the processing and analysis of large volumes of data and also promote the finding of innovative solutions to complex problems.
In this Special Issue, we invite researchers, academics, and practitioners to submit original research articles, reviews, and case studies that explore the recent advances in and applications of machine learning in pattern recognition.
Dr. Verónica Vasconcelos
Dr. Maryam Abbasi
Guest Editors
Manuscript Submission Information
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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.
Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- pattern recognition
- machine learning
- deep learning
- image processing
- image segmentation
- image detection
- image classification
- biometrics
- computer vision
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