Advances in Electron Probe Microanalysis and Microscopy

A special issue of Minerals (ISSN 2075-163X). This special issue belongs to the section "Crystallography and Physical Chemistry of Minerals & Nanominerals".

Deadline for manuscript submissions: 30 June 2025 | Viewed by 50

Special Issue Editor


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Guest Editor
Electron Microscope Laboratory, School of Dentistry, The University of Missouri-Kansas City, Kansas City, MO 64108, USA
Interests: mineralogy; petrology; mineral deposits; materials science; biomaterial; electron microbeam and X-ray techniques and applications in materials science and biological sciences
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Special Issue Information

Dear Colleagues,

Recent advances in quantitative electron probe microanalysis (EPMA) and related microscopy imaging techniques include the following: (1) a higher sensitivity and resolution for trace and light element analysis, (2) a higher spatial resolution at a low accelerating voltage with enhanced FEG electron optics, (3) standard characterization and development, (4) improved EDS and WDS detector technology, (5) advanced software algorithms for automated quantification and phase identification, and (6) artificial intelligence and machine learning techniques for standardless quantification. These advances have increased the precision, accuracy, reliability and versatility of electron probe microanalysis and microscopy techniques and methods, enabling the characterization of minerals and other materials at micro- and nanoscales in various scientific and industrial fields such as geology, materials science, biology, and nanotechnology.

This Special Issue on electron probe microanalysis and microscopy will focus on recent advances in these techniques and the characterization of minerals and related synthetic materials (e.g., minerals, rocks, bones, teeth, biomaterials). The scope of this Special Issue includes, but is not limited to, electron probe microanalysis (WDS/EDS), scanning electron microscopy (SEM), transmission electron microscopy (TEM/STEM), microanalysis standards and reference materials, analytical procedures, and sample preparation methods.

Dr. Donggao Zhao
Guest Editor

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Minerals is an international peer-reviewed open access monthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • electron probe microanalysis and microscopy
  • scanning electron microscopy
  • transmission electron microscopy
  • microanalysis standards and reference materials
  • analytical procedures
  • characterization of minerals and related synthetic materials

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Published Papers

This special issue is now open for submission, see below for planned papers.

Planned Papers

The below list represents only planned manuscripts. Some of these manuscripts have not been received by the Editorial Office yet. Papers submitted to MDPI journals are subject to peer-review.

Title: Available standards reference materials for microanalysis
Authors: Donggao Zhao
Affiliation: University of Missouri-Kansas City

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