Electron Microscopy in Nanotechnology
A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Nanophotonics Materials and Devices".
Deadline for manuscript submissions: closed (25 March 2020) | Viewed by 3370
Special Issue Editor
Special Issue Information
Dear Colleagues,
New or improved nanostructured materials and devices are at the core of developments in areas such as catalysis, electrochemical energy storage or photovoltaics, as well as for the information revolution with new memory and computational concepts. Understanding the structure of these materials and devices, their defects and their response to various stimuli is essential to developing structure–property correlations and using these as the basis for a digital twin.
With the recent developments in electron microscopy, we have established unprecedented capabilities to characterize the structure and structural changes at the nanometer and atomic scale under dynamic conditions, providing new insights into reactions and physical processes by directly imaging transient structures. Moreover, microscopy techniques have been developed that provide access to new structural features or functional properties, e.g. 4D-STEM techniques as the basis for a range of characterization methods, from orientation mapping to the analysis of glasses and disordered polymers, to imaging magnetic and electric fields in materials or devices.
This Special Issue of Nanomaterials will attempt to provide an overview of these new microscopy developments and how they have been applied to develop an increasingly deep understanding in the materials sciences with a focus on energy-related applications and information technology.
Prof. Dr. Christian Kübel
Guest Editor
Manuscript Submission Information
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Keywords
- Electron microscopy
- In situ microscopy
- 4D-STEM
- Spectroscopy
- Correlative characterization
- Catalysis
- Batteries
- Photovoltaics
- Magnonics
- Memristors
