Emerging Topics in Structured Light
A special issue of Photonics (ISSN 2304-6732). This special issue belongs to the section "Lasers, Light Sources and Sensors".
Deadline for manuscript submissions: closed (31 March 2024) | Viewed by 14567
Special Issue Editors
Interests: structured light metrology; optical surface metrology; portable and in-situ metrology; optical system calibration; optical deflectometry; fringe projection profilometry
Interests: optical measurement; vision-based measurement; intelligent sensing and diagnosis; structural health/condition monitoring; fault diagnosis; optical coherence tomography and its applications; fringe-based dynamic measurement
Interests: optical freeform metrology; 3D structure‒light measuring; deflectometric measuring technology; computing optical imaging
Special Issue Information
Dear Colleagues,
Techniques based on structured light are essential optical methods with wide applications in many fields, including optical metrology, 3D imaging and sensing, non-destructive testing, microstructure fabrication, intelligent driving control, etc. Structured light technology integrates numerous techniques, such as structured-light generation, system calibration/alignment, feature matching, signal analysis, data fusion, phase shifting and unwrapping, reconstruction, system integration, and system control and programming, while crossing multiple disciplines in mathematics, control, computing science, signal processing, electronics, and mechanical engineering.
Technological breakthroughs in key fundamental science represented by photonic, material, and computing drive the future of structured light technology toward automation, smart, and miniaturization. For example, an artificial intelligence algorithm is introduced into the structured-light technique for speed improvement and intelligence. Metasurfaces can replace bulk optics made of natural materials using thin and flat elements, combining multiple functions in single optical elements, and realizing the novel optical components of structured-light system, e.g., metalenses and metasurface-based diffractive optical elements.
This Special Issue aims at presenting an overview of cutting-edge research vision, results, and applications of structured light techniques including Gray-coding structured light, fringe projection profilometry, 3D polarization imaging, deflectometry, etc. We welcome broad, visionary contributions of short research reports as well as collections of reviews of accomplishments. We are excited to invite researchers to submit their contributions to this Special Issue. Topics include but are not limited to:
- Structured light in optical metrology;
- Structured light in 3D imaging;
- Structured-light-based sensing technique;
- Structured light in fault diagnosis;
- Structured light in intelligent driving control;
- Structured-light-based fabrication technique;
- Structured-light technique based on artificial intelligence;
- Structured-light technology integrated with multi-modal data;
- Structured-light-based extreme technology including super-fast, super-depth-of-field, super-dynamic-range, super-high-precision, super-large/small-size-measurement, and so on, features;
- Metasurface-based structured-light technique;
- Structured-light-based and fringe-based structural dynamic measurement;
- New industry applications.
Dr. Yongjia Xu
Prof. Dr. Jianfeng Zhong
Dr. Zhenqi Niu
Guest Editors
Manuscript Submission Information
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Keywords
- structured light technique
- optical metrology
- optical imaging
- optical sensing
- non-destructive testing
- computing optics
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