Computer Vision and Sensing Technologies for Industrial Quality Inspection: 2nd Edition
A special issue of Sensors (ISSN 1424-8220). This special issue belongs to the section "Sensing and Imaging".
Deadline for manuscript submissions: 30 June 2025 | Viewed by 8
Special Issue Editors
Interests: computer vision; optical inspection; quality management; automated industrial inspection
Special Issues, Collections and Topics in MDPI journals
Interests: image processing; computer vision; signal filtering; artificial intelligence; grey system with applications
Special Issues, Collections and Topics in MDPI journals
Interests: ergonomics and design; ambient intelligence; industrial management
Special Issues, Collections and Topics in MDPI journals
Special Issue Information
Dear Colleagues,
Although quality inspections play an essential role in successful operations, currently, finding effective ways to carry them out can be a challenge. Combined with advanced computer vision and sensing technologies, quality inspection could become an essential tool in various intelligent applications in smart manufacturing and production, such as object detection, classification, tracking, and counting. The aim is to achieve human-level or higher precision in quality inspection with automation. Computer-vision-based applications minimize human intervention, optimize operational efficiency, and reduce labor costs. In addition, new sensing technologies have provided us with an excellent ability to measure, inspect, sort, and grade products effectively and efficiently.
This Special Issue will include research papers reporting on cases studies of artificial intelligence techniques and will showcase the need to optimize algorithms, inference frameworks, and hardware accelerators in order to obtain good performance in quality inspection. It will mainly focus on computer vision and sensing technologies for industrial quality inspection, with possible topics including, but not limited to, imaging techniques, image processing methods, vision systems, and system optimization. Articles on industrial inspection are also welcome, on topics such as quality inspection using machine learning and data-driven methods. Submissions of review articles and original research papers are invited for this Special Issue.
Prof. Dr. Hong-Dar Lin
Prof. Dr. Cheng-Hsiung Hsieh
Prof. Dr. Hsin-Chieh Wu
Guest Editors
Manuscript Submission Information
Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.
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Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.
Keywords
- computer vision
- sensing technologies
- industrial quality inspection
- automatic optical inspection
- artificial intelligence techniques
- machine learning
- deep learning
