Search Results (8)

The computational analysis of InAs/GaSb type-II superlattices utilizing density functional theory (DFT) with pseudopotentials has been performed. The PBE+U method was employed to correct for the strong correlation effects of the P orbitals of In, As, Ga, and Sb, thereby improving the accuracy of the bandgap calculations. The study investigated the impact of the number of layers in the InAs and GaSb bulk materials on the superlattice bandgap. The results revealed that as the number of InAs layers increased while keeping the number of GaSb layers constant, the bandgap decreased. Conversely, when the number of GaSb layers increased with a constant number of InAs layers, the bandgap increased. In conjunction with the interface issues and vacancy defects frequently encountered in InAs/GaSb type-II superlattices, electronic structure analyses indicate that InAs, as the primary electron aggregator, significantly influences the modulation of the superlattice bandgap. Full article

We report a novel dual-band barrier infrared detector (DBIRD) design using InAs/GaSb type-II superlattices (T2SLs). The DBIRD structure consists of back-to-back barrier diodes: a “blue channel” (BC) diode which has an nBp architecture, an n-type layer of a larger bandgap for absorbing the blue band infrared/barrier/p-type layer, and a “red channel” (RC) diode which has a pBn architecture, a p-type layer of a smaller bandgap for absorbing the red band infrared/barrier/n-type layer. Each has a unipolar barrier using a T2SL lattice matched to a GaSb substrate to impede the flow of majority carriers from the absorbing layer. Each channel in the DBIRD can be independently accessed with a low bias voltage as is preferable for high-speed thermal imaging. The device modeling of DBIRDs and simulation results of the current–voltage characteristics under dark and illuminated conditions are also presented. They predict that the dual-band operation of the DBIRD will produce low dark currents and 45–56% quantum efficiencies for the in-band photons in the BC with ${\lambda }_c$ = 5.58 μm, and a nearly constant 32% in the RC with ${\lambda }_c$ = 8.05 μm. The spectral quantum efficiency of the BC for 500 K blackbody radiation is approximately 50% over the range of $\lambda$ = 3–4.7 μm, while that of the RC has a peak of 42% at 5.9 μm. The DBIRD may provide improved high-speed dual-band imaging in comparison with NBn dual-band detectors. Full article

Recently, there has been significant interest in type-II superlattice (T2SL) infrared detectors based on both InAs/GaSb and InAs/InAsSb material systems, and fully operating devices have been presented in the mid- (MWIR) and long-wavelength (LWIR) infrared ranges. In addition, theoretical simulations and experimental reports show high-performance T2SL devices in the very-long-wavelength infrared range (VLWIR) (cutoff wavelength, λ_c ≥ 12 μm). Devices in this wavelength range are essential for space-based applications. In VLWIR, the existing detectors with satisfactory performance are extrinsic silicon detectors operating under heavy, bulky and short-lifetime multistage cryocoolers. These disadvantages are mainly critical for space applications, and thus, developing a device exhibiting a higher operating temperature (HOT) is of high priority. We report on a photoconductive T2SL InAs/InAsSb detector with λ_c > 18 μm (limited by a GaAs substrate) and high-operating-temperature (HOT) conditions (T = 210–240 K) grown on thick semi-insulating GaA substrates by molecular beam epitaxy (MBE). Full article

Type-II superlattices (T2SLs) are emerging as next-generation materials for infrared detectors. The epitaxial quality of T2SLs is of great importance to the performance of infrared detectors such as dark current and detectivity. Herein, we explore the effect of the native GaSb oxide layer on the surface morphology and crystal quality of InAs/GaSb T2SLs grown with molecular beam epitaxy. The experimental results demonstrate that the thickness of the oxidation layer on GaSb substrates gradually increases over time and is saturated at around 73 Å in the natural oxidation condition. Moreover, the oxidation process is sensitive to humidity. As the thickness of the GaSb oxide layer increases from 18.79 Å to 61.54 Å, the full width at half maximum of the first satellite peak increases from 38.44 to 61.34 arcsec in X-ray diffraction measurements, and the root mean square roughness increases from 0.116 nm to 0.171 nm in atomic force microscopy measurements. Our results suggest that the thickness of the GaSb oxide layer should be less than 55 Å to obtain smooth buffer layers and qualified superlattices. The work provides an optimized direction for achieving high-quality superlattices for infrared optoelectronic devices. Full article

In this paper, the study of defects in InAs/GaSb type-II superlattices using high-resolution an x-ray diffraction method as well as scanning (SEM) and transmission (TEM) electron microscopy is presented. The investigated superlattices had 200 (#SL200), 300 (#SL300), and 400 (#SL400) periods and were grown using molecular beam epitaxy. The growth conditions differed only in growth temperature, which was 370 °C for #SL400 and #SL200, and 390 °C for #SL300. A wings-like diffuse scattering was observed in reciprocal space maps of symmetrical (004) GaSb reflection. The micrometer-sized defect conglomerates comprised of stacking faults, and linear dislocations were revealed by the analysis of diffuse scattering intensity in combination with SEM and TEM imaging. The following defect-related parameters were obtained: (1) integrated diffuse scattering intensity of 0.1480 for #SL400, 0.1208 for #SL300, and 0.0882 for #SL200; (2) defect size: (2.5–3) μm × (2.5–3) μm –#SL400 and #SL200, (3.2–3.4) μm × (3.7–3.9) μm –#SL300; (3) defect diameter: ~1.84 μm –#SL400, ~2.45 μm –#SL300 and ~2.01 μm –#SL200; (4) defect density: 1.42 × 10⁶ cm⁻² –#SL400, 1.01 × 10⁶ cm⁻² –#SL300, 0.51 × 10⁶ cm⁻² –#SL200; (5) diameter of stacking faults: 0.14 μm and 0.13 μm for #SL400 and #SL200, 0.30 μm for #SL300. Full article

We report on the development of thermoelectrically cooled (TE-cooled) InAs/GaSb type-II superlattice (T2SL) single element infrared (IR) photodetectors and exemplify their applicability for real-time IR spectroscopy in the mid-infrared in a possible application. As the European Union’s Restriction of Hazardous Substances (RoHS) threatens the usage of the state-of-the-art detector material mercury cadmium telluride (MCT), RoHS-compatible alternatives to MCT have to be established for IR detection. We use bandgap engineered InAs/GaSb T2SLs to tailor the temperature-dependent bandgap energy for detection throughout the required spectral range. Molecular beam epitaxy of superlattice samples is performed on GaAs substrates with a metamorphic GaAsSb buffer layer. Photolithographic processing yields laterally-operated T2SL photodetectors. Integrated in a TE-cooled IR detector module, such T2SL photodetectors can be an alternative to MCT photodetectors for spectroscopy applications. Here, we exemplify this by exchanging a commercially available MCT-based IR detector module with our T2SL-based IR detector module in a real-time mid-infrared backscattering spectroscopy system for substance identification. The key detector requirements imposed by the spectroscopy system are a MHz-bandwidth, a broad spectral response, and a high signal-to-noise ratio, all of which are covered by the reported T2SL-based IR detector module. Hence, in this paper, we demonstrate the versatility of TE-cooled InAs/GaSb T2SL photodetectors and their applicability in an IR spectroscopy system. Full article

We present a rigorous model for the overall band structure calculation using the perturbative k $·$ p approach for arbitrary layered cubic zincblende semiconductor nanostructures. This approach, first pioneered by Kohn and Luttinger, is faster than atomistic ab initio approaches and provides sufficiently accurate information for optoelectronic processes near high symmetry points in semiconductor crystals. k $·$ p Hamiltonians are discretized and diagonalized using a finite element method (FEM) with smoothed mesh near interface edges and different high order Lagrange/Hermite basis functions, hence enabling accurate determination of bound states and related quantities with a small number of elements. Such properties make the model more efficient than other numerical models that are usually used. Moreover, an energy-dependent effective mass non-parabolic model suitable for large gap materials is also included, which offers fast and reasonably accurate results without the need to solve the full multi-band Hamiltonian. Finally, the tools are validated on three semiconductor nanostructures: (1) the bound energies of a finite quantum well using the energy-dependent effective mass non-parabolic model; (2) the InAs bulk band structure; and (3) the electronic band structure for the absorber region of photodetectors based on a type-II InAs/GaSb superlattice at room temperature. The tools are shown to work on simple and sophisticated designs and the results show very good agreement with recently published experimental works. Full article

Electrical and optical properties of interband cascade infrared photodetectors with InAs/GaSb type-II superlattice absorbers are investigated in this work. We compare the detection parameters of detectors grown on the native GaSb substrate and lattice-mismatched GaAs substrate and seek solutions to enhance device performance, specifically with using an optical immersion. The detectors grown on GaAs have better detection parameters at room temperature, but at lower temperatures the misfit dislocations become more important and detectors grown on GaSb become better. Full article