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18 pages, 904 KB  
Article
Exploiting Data Compression for Adaptive Block Placement in Hybrid Caches
by Beomjun Kim, Yongtae Kim, Prashant Nair and Seokin Hong
Electronics 2022, 11(2), 240; https://doi.org/10.3390/electronics11020240 - 12 Jan 2022
Viewed by 2438
Abstract
STT-RAM (Spin-Transfer Torque Random Access Memory) appears to be a viable alternative to SRAM-based on-chip caches. Due to its high density and low leakage power, STT-RAM can be used to build massive capacity last-level caches (LLC). Unfortunately, STT-RAM has a much longer write [...] Read more.
STT-RAM (Spin-Transfer Torque Random Access Memory) appears to be a viable alternative to SRAM-based on-chip caches. Due to its high density and low leakage power, STT-RAM can be used to build massive capacity last-level caches (LLC). Unfortunately, STT-RAM has a much longer write latency and a much greater write energy than SRAM. Researchers developed hybrid caches made up of SRAM and STT-RAM regions to cope with these challenges. In order to store as many write-intensive blocks in the SRAM region as possible in hybrid caches, an intelligent block placement policy is essential. This paper proposes an adaptive block placement framework for hybrid caches that incorporates metadata embedding (ADAM). When a cache block is evicted from the LLC, ADAM embeds metadata (i.e., write intensity) into the block. Metadata embedded in the cache block are then extracted and used to determine the block’s write intensity when it is fetched from main memory. Our research demonstrates that ADAM can enhance performance by 26% (on average) when compared to a baseline block placement scheme. Full article
(This article belongs to the Section Computer Science & Engineering)
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18 pages, 6328 KB  
Article
Comprehensive Study of Side-Channel Attack on Emerging Non-Volatile Memories
by Mohammad Nasim Imtiaz Khan, Shivam Bhasin, Bo Liu, Alex Yuan, Anupam Chattopadhyay and Swaroop Ghosh
J. Low Power Electron. Appl. 2021, 11(4), 38; https://doi.org/10.3390/jlpea11040038 - 28 Sep 2021
Cited by 15 | Viewed by 5489
Abstract
Emerging Non-Volatile Memories (NVMs) such as Magnetic RAM (MRAM), Spin-Transfer Torque RAM (STTRAM), Phase Change Memory (PCM) and Resistive RAM (RRAM) are very promising due to their low (static) power operation, high scalability and high performance. However, these memories bring new threats to [...] Read more.
Emerging Non-Volatile Memories (NVMs) such as Magnetic RAM (MRAM), Spin-Transfer Torque RAM (STTRAM), Phase Change Memory (PCM) and Resistive RAM (RRAM) are very promising due to their low (static) power operation, high scalability and high performance. However, these memories bring new threats to data security. In this paper, we investigate their vulnerability against Side Channel Attack (SCA). We assume that the adversary can monitor the supply current of the memory array consumed during read/write operations and recover the secret key of Advanced Encryption Standard (AES) execution. First, we show our analysis of simulation results. Then, we use commercial NVM chips to validate the analysis. We also investigate the effectiveness of encoding against SCA on emerging NVMs. Finally, we summarize two new flavors of NVMs that can be resilient against SCA. To the best of our knowledge, this is the first attempt to do a comprehensive study of SCA vulnerability of the majority of emerging NVM-based cache. Full article
(This article belongs to the Special Issue Low-Power Hardware Security)
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39 pages, 12006 KB  
Review
Comprehensive Study of Security and Privacy of Emerging Non-Volatile Memories
by Mohammad Nasim Imtiaz Khan and Swaroop Ghosh
J. Low Power Electron. Appl. 2021, 11(4), 36; https://doi.org/10.3390/jlpea11040036 - 24 Sep 2021
Cited by 16 | Viewed by 6065
Abstract
Several promising non-volatile memories (NVMs) such as magnetic RAM (MRAM), spin-transfer torque RAM (STTRAM), ferroelectric RAM (FeRAM), resistive RAM (RRAM), and phase-change memory (PCM) are being investigated to keep the static leakage within a tolerable limit. These new technologies offer high density and [...] Read more.
Several promising non-volatile memories (NVMs) such as magnetic RAM (MRAM), spin-transfer torque RAM (STTRAM), ferroelectric RAM (FeRAM), resistive RAM (RRAM), and phase-change memory (PCM) are being investigated to keep the static leakage within a tolerable limit. These new technologies offer high density and consume zero leakage power and can bridge the gap between processor and memory. The desirable properties of emerging NVMs make them suitable candidates for several applications including replacement of conventional memories. However, their unique characteristics introduce new data privacy and security issues. Some of them are already available in the market as discrete chips or a part of full system implementation. They are considered to become ubiquitous in future computing devices. Therefore, it is important to ensure their security/privacy issues. Note that these NVMs can be considered for cache, main memory, or storage application. They are also suitable to implement in-memory computation which increases system throughput and eliminates von Neumann bottleneck. Compute-capable NVMs impose new security and privacy challenges that are fundamentally different than their storage counterpart. This work identifies NVM vulnerabilities and attack vectors originating from the device level all the way to circuits and systems, considering both storage and compute applications. We also summarize the circuit/system-level countermeasures to make the NVMs robust against security and privacy issues. Full article
(This article belongs to the Special Issue Low-Power Hardware Security)
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24 pages, 626 KB  
Article
DESTINY: A Comprehensive Tool with 3D and Multi-Level Cell Memory Modeling Capability
by Sparsh Mittal, Rujia Wang and Jeffrey Vetter
J. Low Power Electron. Appl. 2017, 7(3), 23; https://doi.org/10.3390/jlpea7030023 - 11 Sep 2017
Cited by 60 | Viewed by 13824
Abstract
To enable the design of large capacity memory structures, novel memory technologies such as non-volatile memory (NVM) and novel fabrication approaches, e.g., 3D stacking and multi-level cell (MLC) design have been explored. The existing modeling tools, however, cover only a few memory technologies, [...] Read more.
To enable the design of large capacity memory structures, novel memory technologies such as non-volatile memory (NVM) and novel fabrication approaches, e.g., 3D stacking and multi-level cell (MLC) design have been explored. The existing modeling tools, however, cover only a few memory technologies, technology nodes and fabrication approaches. We present DESTINY, a tool for modeling 2D/3D memories designed using SRAM, resistive RAM (ReRAM), spin transfer torque RAM (STT-RAM), phase change RAM (PCM) and embedded DRAM (eDRAM) and 2D memories designed using spin orbit torque RAM (SOT-RAM), domain wall memory (DWM) and Flash memory. In addition to single-level cell (SLC) designs for all of these memories, DESTINY also supports modeling MLC designs for NVMs. We have extensively validated DESTINY against commercial and research prototypes of these memories. DESTINY is very useful for performing design-space exploration across several dimensions, such as optimizing for a target (e.g., latency, area or energy-delay product) for a given memory technology, choosing the suitable memory technology or fabrication method (i.e., 2D v/s 3D) for a given optimization target, etc. We believe that DESTINY will boost studies of next-generation memory architectures used in systems ranging from mobile devices to extreme-scale supercomputers. The latest source-code of DESTINY is available from the following git repository: https://bitbucket.org/sparshmittal/destinyv2. Full article
(This article belongs to the Special Issue Design Methodologies for Power Reduction in Consumer Electronics)
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27 pages, 702 KB  
Review
A Survey of Soft-Error Mitigation Techniques for Non-Volatile Memories
by Sparsh Mittal
Computers 2017, 6(1), 8; https://doi.org/10.3390/computers6010008 - 13 Feb 2017
Cited by 30 | Viewed by 11869
Abstract
Non-volatile memories (NVMs) offer superior density and energy characteristics compared to the conventional memories; however, NVMs suffer from severe reliability issues that can easily eclipse their energy efficiency advantages. In this paper, we survey architectural techniques for improving the soft-error reliability of NVMs, [...] Read more.
Non-volatile memories (NVMs) offer superior density and energy characteristics compared to the conventional memories; however, NVMs suffer from severe reliability issues that can easily eclipse their energy efficiency advantages. In this paper, we survey architectural techniques for improving the soft-error reliability of NVMs, specifically PCM (phase change memory) and STT-RAM (spin transfer torque RAM). We focus on soft-errors, such as resistance drift and write disturbance, in PCM and read disturbance and write failures in STT-RAM. By classifying the research works based on key parameters, we highlight their similarities and distinctions. We hope that this survey will underline the crucial importance of addressing NVM reliability for ensuring their system integration and will be useful for researchers, computer architects and processor designers. Full article
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26 pages, 1284 KB  
Review
Low Power Design for Future Wearable and Implantable Devices
by Katrine Lundager, Behzad Zeinali, Mohammad Tohidi, Jens K. Madsen and Farshad Moradi
J. Low Power Electron. Appl. 2016, 6(4), 20; https://doi.org/10.3390/jlpea6040020 - 20 Oct 2016
Cited by 36 | Viewed by 16194
Abstract
With the fast progress in miniaturization of sensors and advances in micromachinery systems, a gate has been opened to the researchers to develop extremely small wearable/implantable microsystems for different applications. However, these devices are reaching not to a physical limit but a power [...] Read more.
With the fast progress in miniaturization of sensors and advances in micromachinery systems, a gate has been opened to the researchers to develop extremely small wearable/implantable microsystems for different applications. However, these devices are reaching not to a physical limit but a power limit, which is a critical limit for further miniaturization to develop smaller and smarter wearable/implantable devices (WIDs), especially for multi-task continuous computing purposes. Developing smaller and smarter devices with more functionality requires larger batteries, which are currently the main power provider for such devices. However, batteries have a fixed energy density, limited lifetime and chemical side effect plus the fact that the total size of the WID is dominated by the battery size. These issues make the design very challenging or even impossible. A promising solution is to design batteryless WIDs scavenging energy from human or environment including but not limited to temperature variations through thermoelectric generator (TEG) devices, body movement through Piezoelectric devices, solar energy through miniature solar cells, radio-frequency (RF) harvesting through antenna etc. However, the energy provided by each of these harvesting mechanisms is very limited and thus cannot be used for complex tasks. Therefore, a more comprehensive solution is the use of different harvesting mechanisms on a single platform providing enough energy for more complex tasks without the need of batteries. In addition to this, complex tasks can be done by designing Integrated Circuits (ICs), as the main core and the most power consuming component of any WID, in an extremely low power mode by lowering the supply voltage utilizing low-voltage design techniques. Having the ICs operational at very low voltages, will enable designing battery-less WIDs for complex tasks, which will be discussed in details throughout this paper. In this paper, a path towards battery-less computing is drawn by looking at device circuit co-design for future system-on-chips (SoCs). Full article
(This article belongs to the Special Issue Recent Advances in Emerging Low Power Circuits and Systems)
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