- Article
Reliability Study of Metal-Oxide Semiconductors in Integrated Circuits
- Boris V. Malozyomov,
- Nikita V. Martyushev,
- Natalia Nikolaevna Bryukhanova,
- Viktor V. Kondratiev,
- Roman V. Kononenko,
- Pavel P. Pavlov,
- Victoria V. Romanova and
- Yuliya I. Karlina
This paper is devoted to the study of CMOS IC parameter degradation during reliability testing. The paper presents a review of literature data on the issue of the reliability of semiconductor devices and integrated circuits and the types of failures...