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Keywords = scandium oxide thin films

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17 pages, 10427 KB  
Article
Analysis of Electrochemical Properties of LT-SOFCs According to Thickness of PrOx Cathode Interlayer
by Ji-Woong Jeon, Jun-Geon Park, Geon-Hyeop Kim, Seung-Heon Lee, Jeong-Woo Shin and Gu-Young Cho
Sustainability 2025, 17(4), 1403; https://doi.org/10.3390/su17041403 - 8 Feb 2025
Viewed by 1745
Abstract
Solid oxide fuel cells (SOFCs) are attracting attention as an eco-friendly power source because they show high power density. However, SOFC requires a high-temperature environment of 800 °C or higher, and accordingly, the problem of thermal stability of the material constituting SOFC has [...] Read more.
Solid oxide fuel cells (SOFCs) are attracting attention as an eco-friendly power source because they show high power density. However, SOFC requires a high-temperature environment of 800 °C or higher, and accordingly, the problem of thermal stability of the material constituting SOFC has been raised. On the other hand, low-temperature solid oxide fuel cells (LT-SOFCs) research is steadily progressing to improve the electrochemical performance at low temperatures by improving the oxygen reduction reaction of the cathode by applying a cathode interlayer of various materials. In this study, LT-SOFCs were manufactured and electrochemically evaluated using praseodymium oxide (PrOx) as a cathode interlayer. Scandium Stabilized Zirconia (ScSZ) pellets were used as electrolyte support for LT-SOFC, and PrOx was deposited by various thicknesses as a cathode interlayer on ScSZ pellets by a sputtering process. Pt and Ni were deposited under the same process conditions for the cathode and anode, respectively. To analyze the thin-film characteristics of the PrOx cathode interlayer, SEM (Scanning Electron Microscopy), X-ray Diffraction (XRD), and XPS (X-ray Photoelectron Spectroscopy) were analyzed. The electrochemical characteristics of LT-SOFCs were evaluated by electrochemical impedance spectroscopy (EIS). Hydrogen was supplied to the anode at the flow rate of 50 sccm, and the performance of LT-SOFC was evaluated at 500 °C by exposing the cathode to the atmosphere. Full article
(This article belongs to the Section Energy Sustainability)
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17 pages, 5623 KB  
Article
Nanocrystalline Cubic Phase Scandium-Stabilized Zirconia Thin Films
by Victor Danchuk, Mykola Shatalov, Michael Zinigrad, Alexey Kossenko, Tamara Brider, Luc Le, Dustin Johnson, Yuri M. Strzhemechny and Albina Musin
Nanomaterials 2024, 14(8), 708; https://doi.org/10.3390/nano14080708 - 18 Apr 2024
Cited by 4 | Viewed by 1818
Abstract
The cubic zirconia (ZrO2) is attractive for a broad range of applications. However, at room temperature, the cubic phase needs to be stabilized. The most studied stabilization method is the addition of the oxides of trivalent metals, such as Sc2 [...] Read more.
The cubic zirconia (ZrO2) is attractive for a broad range of applications. However, at room temperature, the cubic phase needs to be stabilized. The most studied stabilization method is the addition of the oxides of trivalent metals, such as Sc2O3. Another method is the stabilization of the cubic phase in nanostructures—nanopowders or nanocrystallites of pure zirconia. We studied the relationship between the size factor and the dopant concentration range for the formation and stabilization of the cubic phase in scandium-stabilized zirconia (ScSZ) films. The thin films of (ZrO2)1−x(Sc2O3)x, with x from 0 to 0.2, were deposited on room-temperature substrates by reactive direct current magnetron co-sputtering. The crystal structure of films with an average crystallite size of 85 Å was cubic at Sc2O3 content from 6.5 to 17.5 mol%, which is much broader than the range of 8–12 mol.% of the conventional deposition methods. The sputtering of ScSZ films on hot substrates resulted in a doubling of crystallite size and a decrease in the cubic phase range to 7.4–11 mol% of Sc2O3 content. This confirmed that the size of crystallites is one of the determining factors for expanding the concentration range for forming and stabilizing the cubic phase of ScSZ films. Full article
(This article belongs to the Special Issue Advanced Nanoscale Materials and (Flexible) Devices)
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17 pages, 5960 KB  
Article
Lead-Free Perovskite Thin Films for Gas Sensing through Surface Acoustic Wave Device Detection
by Nicoleta Enea, Valentin Ion, Cristian Viespe, Izabela Constantinoiu, Anca Bonciu, Maria Luiza Stîngescu, Ruxandra Bîrjega and Nicu Doinel Scarisoreanu
Nanomaterials 2024, 14(1), 39; https://doi.org/10.3390/nano14010039 - 22 Dec 2023
Cited by 1 | Viewed by 2328
Abstract
Thin film technology shows great promise in fabricating electronic devices such as gas sensors. Here, we report the fabrication of surface acoustic wave (SAW) sensors based on thin films of (1 − x) Ba(Ti0.8Zr0.2)O3−x(Ba0.7Ca0.3 [...] Read more.
Thin film technology shows great promise in fabricating electronic devices such as gas sensors. Here, we report the fabrication of surface acoustic wave (SAW) sensors based on thin films of (1 − x) Ba(Ti0.8Zr0.2)O3−x(Ba0.7Ca0.3)TiO3 (BCTZ50, x = 50) and Polyethylenimine (PEI). The layers were deposited by two laser-based techniques, namely pulsed laser deposition (PLD) for the lead-free material and matrix assisted pulsed laser evaporation (MAPLE) for the sensitive polymer. In order to assay the impact of the thickness, the number of laser pulses was varied, leading to thicknesses between 50 and 350 nm. The influence of BCTZ film’s crystallographic features on the characteristics and performance of the SAW device was studied by employing substrates with different crystal structures, more precisely cubic Strontium Titanate (SrTiO3) and orthorhombic Gadolinium Scandium Oxide (GdScO3). The SAW sensors were further integrated into a testing system to evaluate the response of the BCTZ thin films with PEI, and then subjected to tests for N2, CO2 and O2 gases. The influence of the MAPLE’s deposited PEI layer on the overall performance was demonstrated. For the SAW sensors based on BCTZ/GdScO3 thin films with a PEI polymer, a maximum frequency shift of 39.5 kHz has been obtained for CO2; eight times higher compared to the sensor without the polymeric layer. Full article
(This article belongs to the Special Issue New Challenges in Designed Nanointerfaces)
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14 pages, 8329 KB  
Article
Multi-Technique Approach for Work Function Exploration of Sc2O3 Thin Films
by Alessio Mezzi, Eleonora Bolli, Saulius Kaciulis, Alessandro Bellucci, Barbara Paci, Amanda Generosi, Matteo Mastellone, Valerio Serpente and Daniele Maria Trucchi
Nanomaterials 2023, 13(8), 1430; https://doi.org/10.3390/nano13081430 - 21 Apr 2023
Cited by 6 | Viewed by 2438
Abstract
Thin films based on scandium oxide (Sc2O3) were deposited on silicon substrates to investigate the thickness effect on the reduction of work function. X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), energy dispersive X-ray reflectivity (EDXR), atomic force microscopy (AFM), [...] Read more.
Thin films based on scandium oxide (Sc2O3) were deposited on silicon substrates to investigate the thickness effect on the reduction of work function. X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), energy dispersive X-ray reflectivity (EDXR), atomic force microscopy (AFM), and ultraviolet photoelectron spectroscopy (UPS) measurements were performed on the films deposited by electron-beam evaporation with different nominal thicknesses (in the range of 2–50 nm) and in multi-layered mixed structures with barium fluoride (BaF2) films. The obtained results indicate that non-continuous films are required to minimize the work function (down to 2.7 eV at room temperature), thanks to the formation of surface dipole effects between crystalline islands and substrates, even if the stoichiometry is far from the ideal one (Sc/O = 0.38). Finally, the presence of BaF2 in multi-layered films is not beneficial for a further reduction in the work function. Full article
(This article belongs to the Special Issue Surface Analysis Techniques for the Study of Advanced Nanostructures)
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9 pages, 3639 KB  
Article
Relationship between Oxygen Defects and Properties of Scandium Oxide Films Prepared by Ion-Beam Sputtering
by Pengfei Kong, Yunti Pu, Ping Ma and Jiliang Zhu
Coatings 2019, 9(8), 517; https://doi.org/10.3390/coatings9080517 - 15 Aug 2019
Cited by 10 | Viewed by 3934
Abstract
Scandium oxide (Sc2O3) thin films with different numbers of oxygen defects were prepared by ion-beam sputtering under different oxygen flow rates. The results showed that the oxygen defects heavily affected crystal phases, optical properties, laser-induced damage threshold (LIDT) and [...] Read more.
Scandium oxide (Sc2O3) thin films with different numbers of oxygen defects were prepared by ion-beam sputtering under different oxygen flow rates. The results showed that the oxygen defects heavily affected crystal phases, optical properties, laser-induced damage threshold (LIDT) and surface quality of Sc2O3 films. The thin film under 0 standard-state cubic centimeter per minute (sccm) oxygen flow rate had the largest number of oxygen defects, which resulted in the lowest transmittance, LIDT and the worst surface quality. In addition, the refractive index of 0 sccm Sc2O3 film could not be measured in the same way. When the oxygen flow rate was 15 sccm, the Sc2O3 film possessed the best transmittance, refractive index, LIDT and surface roughness due to the lowest number of oxygen defects. This work elucidated the relationship between oxygen defects and properties of Sc2O3 films. Controlling oxygen flow rate was an important step of limiting the number of oxygen defects, which is of great significance for industrial production. Full article
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