Metal Halide Nanomaterials-Based X-Ray Detection and Imaging
A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Physical Chemistry at Nanoscale".
Deadline for manuscript submissions: 20 May 2025 | Viewed by 104
Special Issue Editor
Special Issue Information
Dear Colleagues,
X-ray detection is required by medical diagnosis, industrial non-destructive inspection, nuclear reaction monitoring, and other fields. Metal halide perovskites, with the advantages of high X-ray absorption, high charge carrier mobility (μ), and long carrier lifetime (τ), show excellent potential in highly sensitive direct X-ray detection. Subsequently, by integrating these materials with pixelated sensor arrays, high-resolution perovskite X-ray imaging detectors can be fabricated.
This Special Issue’s scope ranges from the synthesis and modification of perovskite semiconductors to deice integration and X-ray detector performance optimization for imaging applications. This Special Issue focuses on both the scientific and engineering aspects of perovskite materials and the corresponding direct X-ray detectors, outlining fundamental properties, defects, and phase transitions which enable the observation of unprecedented physical phenomena at the nanoscale and the creation of state-of-the-art X-ray imaging detectors.
We look forward to receiving your contributions.
Dr. Yanliang Liu
Guest Editor
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Keywords
- perovskite semiconductor
- crystal growth
- defect passivation
- ion migration inhibition
- heterogeneous integration
- direct X-ray detection
- X-ray imaging
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