- freely available
Studying the Effect of Deposition Conditions on the Performance and Reliability of MEMS Gas Sensors
AbstractIn this paper, the reliability of a micro-electro-mechanical system (MEMS)-based gas sensor has been investigated using Three Dimensional (3D) coupled multiphysics Finite Element (FE) analysis. The coupled field analysis involved a two-way sequential electro- thermal fields coupling and a one-way sequential thermal-structural fields coupling. An automated substructuring code was developed to reduce the computational cost involved in simulating this complicated coupled multiphysics FE analysis by up to 76 percent. The substructured multiphysics model was then used to conduct a parametric study of the MEMS-based gas sensor performance in response to the variations expected in the thermal and mechanical characteristics of thin films layers composing the sensing MEMS device generated at various stages of the microfabrication process. Whenever possible, the appropriate deposition variables were correlated in the current work to the design parameters, with good accuracy, for optimum operation conditions of the gas sensor. This is used to establish a set of design rules, using linear and nonlinear empirical relations, which can be utilized in real-time at the design and development decision-making stages of similar gas sensors to enable the microfabrication of these sensors with reliable operation.
Share & Cite This Article
Sadek, K.; Moussa, W. Studying the Effect of Deposition Conditions on the Performance and Reliability of MEMS Gas Sensors. Sensors 2007, 7, 319-340.View more citation formats
Sadek K, Moussa W. Studying the Effect of Deposition Conditions on the Performance and Reliability of MEMS Gas Sensors. Sensors. 2007; 7(3):319-340.Chicago/Turabian Style
Sadek, Khaled; Moussa, Walied. 2007. "Studying the Effect of Deposition Conditions on the Performance and Reliability of MEMS Gas Sensors." Sensors 7, no. 3: 319-340.
Notes: Multiple requests from the same IP address are counted as one view.