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Journal: Micromachines, 2020
Volume: 11
Number: 446

Article: Semi-Automated Extraction of the Distribution of Single Defects for nMOS Transistors
Authors: by Bernhard Stampfer, Franz Schanovsky, Tibor Grasser and Michael Waltl
Link: https://www.mdpi.com/2072-666X/11/4/446

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