MDPI and ACS Style
Niu, Y.; Gonzalez-Abad, S.; Frisenda, R.; Marauhn, P.; Drüppel, M.; Gant, P.; Schmidt, R.; Taghavi, N.S.; Barcons, D.; Molina-Mendoza, A.J.;
et al. Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2. Nanomaterials 2018, 8, 725.
https://doi.org/10.3390/nano8090725
AMA Style
Niu Y, Gonzalez-Abad S, Frisenda R, Marauhn P, Drüppel M, Gant P, Schmidt R, Taghavi NS, Barcons D, Molina-Mendoza AJ,
et al. Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2. Nanomaterials. 2018; 8(9):725.
https://doi.org/10.3390/nano8090725
Chicago/Turabian Style
Niu, Yue, Sergio Gonzalez-Abad, Riccardo Frisenda, Philipp Marauhn, Matthias Drüppel, Patricia Gant, Robert Schmidt, Najme S. Taghavi, David Barcons, Aday J. Molina-Mendoza,
and et al. 2018. "Thickness-Dependent Differential Reflectance Spectra of Monolayer and Few-Layer MoS2, MoSe2, WS2 and WSe2" Nanomaterials 8, no. 9: 725.
https://doi.org/10.3390/nano8090725