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Volume 2
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Correction to J. Low Power Electron. Appl. 2012, 2(2), 168-179.
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Correction

Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179

by
Ameet Chavan
1,
Praveen Palakurthi
1,
Eric MacDonald
1,*,
Joseph Neff
2 and
Eric Bozeman
2
1
University of Texas at El Paso, Electrical and Computer Engineering, El Paso, TX 79968, USA
2
SPAWAR System Center, Navy, San Diego, CA 92152, USA
*
Author to whom correspondence should be addressed.
J. Low Power Electron. Appl. 2012, 2(4), 210; https://doi.org/10.3390/jlpea2040210
Submission received: 25 September 2012 / Accepted: 25 September 2012 / Published: 26 September 2012
Versions Notes
We have found the following error in the title of this article which was recently published in J. Low Power Electron. Appl. [1]:
The correct title should be: Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation.
We apologize for any inconvenience caused to the readers.

References

  1. Chavan, A.; Palakurthi, P.; MacDonald, E.; Neff, J.; Bozeman, E. Hardened Flip-Flop Optimized for Subthreshold Operation Heavy Ion Characterization of a Radiation. J. Low Power Electron. Appl. 2012, 2, 168–179. [Google Scholar] [CrossRef]

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MDPI and ACS Style

Chavan, A.; Palakurthi, P.; MacDonald, E.; Neff, J.; Bozeman, E. Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179. J. Low Power Electron. Appl. 2012, 2, 210. https://doi.org/10.3390/jlpea2040210

AMA Style

Chavan A, Palakurthi P, MacDonald E, Neff J, Bozeman E. Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179. Journal of Low Power Electronics and Applications. 2012; 2(4):210. https://doi.org/10.3390/jlpea2040210

Chicago/Turabian Style

Chavan, Ameet, Praveen Palakurthi, Eric MacDonald, Joseph Neff, and Eric Bozeman. 2012. "Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179" Journal of Low Power Electronics and Applications 2, no. 4: 210. https://doi.org/10.3390/jlpea2040210

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