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Stochastically Estimating Modular Criticality in Large-Scale Logic Circuits Using Sparsity Regularization and Compressive Sensing
 
 
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J. Low Power Electron. Appl. 2015, 5(2), 38-56; https://doi.org/10.3390/jlpea5020038
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article pdf uploaded. 27 March 2015 10:51 CET Version of Record https://www.mdpi.com/2079-9268/5/2/38/pdf
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