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Journal: Electronics, 2022
Volume: 11
Number: 972

Article: SEU Tolerance Efficiency of Multiple Layout-Hardened 28 nm DICE D Flip-Flops
Authors: by Yaqing Chi, Chang Cai, Ze He, Zhenyu Wu, Yahao Fang, Jianjun Chen and Bin Liang
Link: https://www.mdpi.com/2079-9292/11/7/972

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