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Journal: Electronics, 2014
Volume: 3
Number: 76
Article:
Morphology, Electrical Performance and Potentiometry of PDIF-CN2 Thin-Film Transistors on HMDS-Treated and Bare Silicon Dioxide
Authors:
by
Fabio Chiarella, Mario Barra, Laura Ricciotti, Alberto Aloisio and Antonio Cassinese
Link:
https://www.mdpi.com/2079-9292/3/1/76
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