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Journal: Electronics, 2016
Volume: 5
Number: 14

Article: Gate Stability of GaN-Based HEMTs with P-Type Gate
Authors: by Matteo Meneghini, Isabella Rossetto, Vanessa Rizzato, Steve Stoffels, Marleen Van Hove, Niels Posthuma, Tian-Li Wu, Denis Marcon, Stefaan Decoutere, Gaudenzio Meneghesso and Enrico Zanoni
Link: https://www.mdpi.com/2079-9292/5/2/14

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