Advanced Technologies for Testing, Diagnosis and Prognosis in Electronic Systems and Devices

Dear Colleagues,

Whether it is complex electronic systems such as radars, communication systems, and mobile phones, or complex electronic devices such as IGBT, CPU, RAM, SOC, and Chiplet, the safe and reliable operation of systems is a primary concern. In recent years, with the development of microelectronics and artificial intelligence technology, advanced technologies associated with the testing, diagnosis, and prediction processes of electronic systems and devices have emerged.

This Special Issue calls for papers on advanced technologies related to testing, diagnosis and prognosis in electronic systems and devices, such as radars, lithium batteries, and integrated circuits; these include, but are not limited to, test methods, health monitoring, fault feature extraction, diagnostic reasoning methods, performance degradation, life prediction, etc.

Prof. Dr. Bing Long
Prof. Dr. Yindong Xiao
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Applied Sciences is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

• test methods
• health monitoring
• fault feature extraction
• diagnostic reasoning methods
• performance degradation
• life prediction
• data-driven methods
• model-based methods
• machine learning
• neural network
• electronic systems
• electronic devices
• integrated circuits
• lithium-ion batteries