Inorganic Crystalline Materials

A section of Crystals (ISSN 2073-4352).

Section Information

Aims

The section “Inorganic Crystalline Materials” provides a forum for advancements in our understanding of the nucleation, growth, processing, structure and property characterizations, and emerging applications of inorganic crystalline materials. Their mechanical, chemical, electronic, magnetic, and optical properties, as well as their diverse applications, are all considered to be of importance. Additionally, we encourage contributors to send articles focused on crystals research on inorganic crystalline materials and their characterization using modern techniques for crystal growth and high-resolution characterization, such as synchrotron radiation and STEM.

Crystals serves as a reference and publication source for the crystal research community. Crystals publishes reviews, regular research articles, and short communications. Our aim is to encourage scientists to publish their experimental, theoretical, and computational results in as much detail as possible so that results can be reproduced. Therefore, there are no restrictions on article length.

Subject Areas

All classes of inorganic crystalline materials, either in bulk or thin films, such as:

  • semiconductors
  • magnetic systems
  • superconductors
  • graphene
  • photonic crystals
  • piezoelectric crystals
  • ferroelectric crystals
  • optical crystals, including nonlinear and laser crystals
  • scintillating crystals

Crystal growth techniques include, but are not limited to:

  • conventional crystal growth, including Bridgman, Czochralski, top seeding, solid state conversion, high temperature flux methods
  • molecular beam, chemical beam, and vapor phase epitaxy, non-classical growth by particle attachment and fusion

Characterization techniques, such as:

  • X-ray diffraction
  • photoluminescence
  • electron microscopy and diffraction
  • neutron diffraction
  • free electron lasers
  • scanning probe microscopy
  • carrier transport
  • magnetic property measurements
  • Rutherford backscattering
  • ellipsometry
  • AFM/PFM
  • STEM

Property characterizations, including but not limited to optical, magnetic, electronic, etc.

  • Fundamental research into:
  • solid-state physics and chemistry
  • crystalline surfaces
  • crystalline structure
  • crystalline interface
  • crystallization mechanisms

Editorial Board

Topical Advisory Panel

Special Issues

Following special issues within this section are currently open for submissions:

Papers Published

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