Deep/Machine Learning in Visual Recognition and Anomaly Detection

A special issue of Electronics (ISSN 2079-9292). This special issue belongs to the section "Electronic Multimedia".

Deadline for manuscript submissions: 15 January 2025 | Viewed by 175

Special Issue Editors


E-Mail Website
Guest Editor
School of Telecommunications Engineering, Xidian University, Xi’an 710071, China
Interests: computer vision; pattern recognition; machine learning

E-Mail Website
Guest Editor
School of Computer Science, Shaanxi Normal University, Xi’an 710062, China
Interests: computer vision; artificial intelligence

Special Issue Information

Dear Colleagues,

The success of machine learning and deep neural networks have facilitated advances in understanding the high-level semantics of visual content. Conventional learning-based visual semantic recognition approaches rely heavily on large-scale training data with dense annotations and consistently fail to estimate accurate semantic labels for unseen categories. The emergence and rapid progress of few-/zero-shot learning make it possible to learn unseen categories from a few labeled or even zero-labeled samples, which advances the extension to practical applications. This Special Issue aims to demonstrate (1) how machine learning algorithms have contributed, and are contributing, to new theories, models, and datasets related to the topic of few-/zero-shot learning; (2) how few-/zero-shot learning can facilitate other tasks such as visual recognition and anomaly detection. The editors hope to collate a group of research results to report the recent developments in the related research topics. In addition, researchers can exchange their innovative ideas on the topic of few-/zero-shot learning in visual recognition and anomaly detection by submitting manuscripts for this Special Issue.

In this Special Issue, original research articles and reviews are welcome. Research areas may include (but are not limited to) the following:

(1) Theoretical advances and algorithm developments in few-/zero-shot learning;

(2) Useful applications of few-/zero-shot learning in visual recognition and anomaly detection;

(3) New datasets and benchmarks for few-/zero-shot learning in visual recognition and anomaly detection.

We look forward to receiving your contributions.

Dr. Yang Liu
Dr. Jin Li
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Electronics is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2400 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • few-/zero-shot learning
  • visual recognition
  • anomaly detection

Published Papers

This special issue is now open for submission.
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