Transmission Electron Microscopy for Investigating Nanomaterials: Structural Analysis, Physical Properties, and Dynamic Behaviors

A special issue of Nanomaterials (ISSN 2079-4991). This special issue belongs to the section "Synthesis, Interfaces and Nanostructures".

Deadline for manuscript submissions: 20 November 2024 | Viewed by 38

Special Issue Editors


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Guest Editor
Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing 101400, China
Interests: transmission electron microscopy

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Guest Editor
Department of Materials Science and Engineering, City University of Hong Kong, Kowloon, Hong Kong
Interests: in-situ TEM; nanomechanics

Special Issue Information

Dear Colleagues,

Transmission electron microscopy (TEM) has made remarkable strides in both technological developments and application fields in the past few decades. Thanks to the invention of the Cs/Cc aberration corrector and the development of ptychography, the spatial resolution of the transmission electron microscope has been drastically enhanced, achieving precision better than 20 pm, while the combination of laser and transmission electron microscopes has advanced the temporal resolution of real-space images into the attosecond regime. Additionally, in-line/off-axis electron holography and 4D-STEM have been successfully employed to investigate the charge density distribution. With its exceptional spatial/time resolution and high flexibility, TEM plays a pivotal role in physics, materials science, biology, medicine, and many other fields.

This Special Issue focuses on the latest cutting-edge theoretical and technological developments of TEM, along with their practical applications for characterizing structures, physical properties, and dynamic behaviors of nanomaterials. Our goal is twofold: first, to accelerate the adoption of emerging TEM techniques for nanomaterial characterization, and second, to chart new directions in transmission electron microscopy by analyzing the challenges encountered during the characterization of nanomaterial properties.

We are delighted to declare that submissions are now open for this Special Issue. Full papers, communications, and reviews are all welcome.

Dr. Wanpeng Li
Dr. Xiaocui Li
Guest Editors

Manuscript Submission Information

Manuscripts should be submitted online at www.mdpi.com by registering and logging in to this website. Once you are registered, click here to go to the submission form. Manuscripts can be submitted until the deadline. All submissions that pass pre-check are peer-reviewed. Accepted papers will be published continuously in the journal (as soon as accepted) and will be listed together on the special issue website. Research articles, review articles as well as short communications are invited. For planned papers, a title and short abstract (about 100 words) can be sent to the Editorial Office for announcement on this website.

Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Nanomaterials is an international peer-reviewed open access semimonthly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 2900 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

  • electron diffraction
  • HRTEM
  • STEM-HAADF/ABF
  • in-line/off-axis electron holography
  • ultrafast TEM, in situ TEM
  • 4D-STEM
  • EELS
  • EDS
  • nanomaterials

Published Papers

This special issue is now open for submission.
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