Quantum Beam Science

Special Issue Editors

Dr. Kouichi Hirata

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Guest Editor

National Metrology Institute of Japan, National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1 Higashi, Tsukuba, Ibaraki, Japan
Interests: material analysis using quantum beams

Dr. Kazumasa Narumi

E-Mail Website
Guest Editor

Department of Advanced Radiation Technology Takasaki Advanced Radiation Research Institute, Quantum Beam Science Research Directorate (QuBS), National Institutes for Quantum and Radiological Science and Technology (QST), Takasaki, Gumma, Japan
Interests: interactions of energetic ions with solids; energy-loss processes of molecular/cluster ions in solids; secondary-electron emissions; sputtering; secondary-ion emissions; radiation damages; ion-beam analyses of materials; ion-beam modification of materials

Special Issue Information

Dear Colleagues,

Surface analysis using charged-particle beams has been playing an important role in various research fields, especially materials science and bioscience. Information on atomic composition and structure, defects, chemical structure, etc. can be obtained with the measurement of energy and/or yield of particles and radiation that emerge from a material irradiated with charged particles, i.e., ions, electrons, positrons, muons, etc. Its importance is still increasing, so that relevant techniques are also being developed from the viewpoint of higher resolution, higher sensitivity, advanced measurement, etc.; for example, in-air analysis using charged-particle beams, which has been developed recently, enables us to characterize biomaterials under wet conditions. In addition, novel beams, such as muon and cluster-ion beams, are increasingly applied to high-sensitivity and high-resolution surface analysis.

Reviews or articles on surface analysis with newly developed methods, modified techniques using charged-particle beams or their applications are the focus of this Special Issue. The issue will include subject matter concerning, but not limited to, the following keywords:

High-resolution depth profiling
High-sensitivity measurement
In-air analysis
Elemental-distribution imaging
RBS
ERDA
SIMS
PIXE
NRA
Applications using materials science, surface physics, surface chemistry, bioscience, drug discovery, geophysics, astrophysics, etc.

Dr. Kouichi Hirata
Dr. Kazumasa Narumi
Guest Editors

Manuscript Submission Information

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Submitted manuscripts should not have been published previously, nor be under consideration for publication elsewhere (except conference proceedings papers). All manuscripts are thoroughly refereed through a single-blind peer-review process. A guide for authors and other relevant information for submission of manuscripts is available on the Instructions for Authors page. Quantum Beam Science is an international peer-reviewed open access quarterly journal published by MDPI.

Please visit the Instructions for Authors page before submitting a manuscript. The Article Processing Charge (APC) for publication in this open access journal is 1600 CHF (Swiss Francs). Submitted papers should be well formatted and use good English. Authors may use MDPI's English editing service prior to publication or during author revisions.

Keywords

Ion beams
Electron/positron beams
Muon beams
High-resolution/sensitivity measurement
In-air analysis
Elemental-distribution imaging
Materials science
Surface physics and chemistry
Bioscience
Geophysics and/or astrophysics

Published Papers (2 papers)

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Research

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13 pages, 3542 KiB

Open AccessArticle

Large Molecular Cluster Formation from Liquid Materials and Its Application to ToF-SIMS

by Kousuke Moritani, Shogo Nagata, Atsushi Tanaka, Kosuke Goto and Norio Inui

Quantum Beam Sci. 2021, 5(2), 10; https://doi.org/10.3390/qubs5020010 - 29 Apr 2021

Cited by 2 | Viewed by 2392

Abstract

Since molecular cluster ion beams are expected to have various chemical effects, they are promising candidates for improving the secondary ion yield of Tof-SIMS. However, in order to clarify the effect and its mechanism, it is necessary to generate molecular cluster ion beams with various chemical properties and systematically examine it. In this study, we have established a method to stably form various molecular cluster ion beams from relatively small amounts of liquid materials for a long time by the bubbling method. Furthermore, we applied the cluster ion beams of water, methanol, methane, and benzene to the primary beam of SIMS and compared the molecular ion yields of aspartic acid. The effect of enhancing the yields of [M+H]⁺ ion of aspartic acid was found to be the largest for the water cluster and small for the methane and benzene clusters. These results indicate that the chemical effect contributes to the desorption/ionization process of organic molecules by the molecular cluster ion beam. Full article

(This article belongs to the Special Issue Surface Analysis of Materials With Charged-Particle Beams)

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Review

Jump to: Research

15 pages, 4757 KiB

Open AccessReview

Time-Of-Flight ERDA for Depth Profiling of Light Elements

by Keisuke Yasuda

Quantum Beam Sci. 2020, 4(4), 40; https://doi.org/10.3390/qubs4040040 - 18 Nov 2020

Cited by 6 | Viewed by 4111

Abstract

The time-of-flight elastic recoil detection analysis (TOF-ERDA) method is one of the ion beam analysis methods that is capable of analyzing light elements in a sample with excellent depth resolution. In this method, simultaneous measurements of recoil ion energy and time of flight are performed, and ion mass is evaluated. The energy of recoil ions is calculated from TOF, which gives better energy resolution than conventional Silicon semiconductor detectors (SSDs). TOF-ERDA is expected to be particularly applicable for the analysis of light elements in thin films. In this review, the principle of TOF-ERDA measurement and details of the measurement equipment along with the performance of the instrumentation, including depth resolution and measurement sensitivity, are described. Examples of TOF-ERDA analysis are presented with a focus on the results obtained from the measurement system developed by the author. Full article

(This article belongs to the Special Issue Surface Analysis of Materials With Charged-Particle Beams)

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