The Role of Hydrogen Incorporation into Amorphous Carbon Films in the Change of the Secondary Electron Yield
Abstract
:1. Introduction
2. Results
2.1. Composition, Electron Emission and Optical Properties of the Coatings
2.2. XPS Measurements
- The relative contribution of the graphitic component decreases and even disappears in the sample 10D;
- The relative contribution attributed to the sp3 carbon and the hydrocarbons increases;
- The asymmetry of the graphitic component becomes less pronounced.
2.3. UPS Measurements
2.4. Raman Spectroscopy
3. Discussion
4. Materials and Methods
5. Conclusions
Supplementary Materials
Author Contributions
Funding
Data Availability Statement
Acknowledgments
Conflicts of Interest
Appendix A. HREELS Measurements
Appendix A.1. Experimental Setup
Appendix A.2. Results
Appendix B. Modelling SEY from Non-Uniform A-Carbon Samples
Appendix B.1. Semi-Empirical Theory of Secondary Electron Emission and Its Application to Graphitic and Polymeric Samples
- all primary electrons have the same range R in a material, which can be described by the power law R = b∙En, with E being the energy of incident electrons, while b is the material constant;
- the number of internal secondary electrons generated in the depth interval (z, z + Δz) is directly proportional to the stopping power of primary electrons S(z) = −dE/dz, ΔN(z) = S(z)Δz/ε, where ε is the effective energy required to create one internal secondary electron;
- the electron stopping power is assumed to be constant, and its average value along the trajectory E/R(E) is frequently used;
- the probability that an internal secondary electron will be emitted is 0.5∙exp(−z/λ), where λ is an electron escape depth (a material dependent parameter).
Appendix B.2. Model Description
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Sample | pD2 (Pa) | C (%) | H (%) | D (%) | O (%) | SEYmax | ET (eV) | ρ (g/cm3) |
---|---|---|---|---|---|---|---|---|
Reference | 0 | 83.4 | 11.7 | 0 | 4.9 | 0.99 | 0.12 | 1.44 |
0.2D | 3.8 × 10−3 | 77.9 | 9.8 | 9.6 | 2.7 | 1.03 | 0.37 | 1.99 |
0.5D | 1.1 × 10−2 | 67.8 | 6.0 | 23.7 | 2.5 | 1.15 | 0.78 | 1.91 |
1D | 2.6 × 10−2 | 52.2 | 6.3 | 39.9 | 1.6 | 1.38 | 1.17 | 2.34 |
10D | 2.2 × 10−1 | 45.2 | 2.8 | 50.4 | 1.6 | 2.03 | 2.29 | 1.15 |
Sample | α/β | Graphitic (%) | sp3 C-H (%) | C-O (%) | C=O (%) | -(C=O)-O- (%) | H + D Content (%) |
---|---|---|---|---|---|---|---|
Reference | 0.45 | 88.14 | 3.29 | 1.91 | 2.55 | 2.01 | 11.7 |
0.2D | 0.50 | 85.17 | 6.43 | 2.41 | 2.57 | 1.73 | 19.4 |
0.5D | 0.58 | 71.09 | 20.4 | 3.75 | 2.46 | 1.05 | 29.7 |
1D | 0.58 | 52.75 | 38.11 | 4.83 | 2.46 | 0.96 | 46.2 |
10D | 1.00 | 0 | 75.99 | 21.53 | 2.35 | 0.13 | 53.2 |
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Bundaleski, N.; Adame, C.F.; Alves, E.; Barradas, N.P.; Cerqueira, M.F.; Deuermeier, J.; Delaup, Y.; Ferraria, A.M.; Ferreira, I.M.M.; Neupert, H.; et al. The Role of Hydrogen Incorporation into Amorphous Carbon Films in the Change of the Secondary Electron Yield. Int. J. Mol. Sci. 2023, 24, 12999. https://doi.org/10.3390/ijms241612999
Bundaleski N, Adame CF, Alves E, Barradas NP, Cerqueira MF, Deuermeier J, Delaup Y, Ferraria AM, Ferreira IMM, Neupert H, et al. The Role of Hydrogen Incorporation into Amorphous Carbon Films in the Change of the Secondary Electron Yield. International Journal of Molecular Sciences. 2023; 24(16):12999. https://doi.org/10.3390/ijms241612999
Chicago/Turabian StyleBundaleski, Nenad, Carolina F. Adame, Eduardo Alves, Nuno P. Barradas, Maria F. Cerqueira, Jonas Deuermeier, Yorick Delaup, Ana M. Ferraria, Isabel M. M. Ferreira, Holger Neupert, and et al. 2023. "The Role of Hydrogen Incorporation into Amorphous Carbon Films in the Change of the Secondary Electron Yield" International Journal of Molecular Sciences 24, no. 16: 12999. https://doi.org/10.3390/ijms241612999