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Journal: Sensors, 2023
Volume: 23
Number: 7498
Article:
Negative Design Margin Realization through Deep Path Activity Detection Combined with Dynamic Voltage Scaling in a 55 nm Near-Threshold 32-Bit Microcontroller
Authors:
by
Run-Ze Yu, Zhen-Hao Li, Xi Deng and Zheng-Lin Liu
Link:
https://www.mdpi.com/1424-8220/23/17/7498
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