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Journal: Sensors, 2025
Volume: 25
Number: 5160

Article: Authentication of Counterfeit Electronics Using Rapid THz Time-of-Flight Imaging
Authors: by Hyeonseung Ryu, Byung Hee Son, Jihwan Kim, Jangsun Kim and Yeong Hwan Ahn
Link: https://www.mdpi.com/1424-8220/25/16/5160

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