An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry
Abstract
:1. Introduction
- (1)
- Dual-frequency heterodyne (DFH) complementary decoding to improve measurement efficiency. Conventional dual-frequency interpolation methods require at least six fringe patterns for phase unwrapping, but our proposed method only needs five, improving measurement efficiency. Additionally, we introduced a phase order complement strategy that does not require extra projected patterns, utilizing the captured fringe patterns themselves to correct potential phase ambiguities.
- (2)
- Polarizers to eliminate specular reflection. The existence of specular reflection is a challenge in the 3D measurement of shiny surfaces. To address this, previous methods have included multi-exposure, adaptive projection, and algorithmic compensation. However, due to specular reflection, even when projection light is dim, saturation can still occur, making it impossible to compute valid phase information, leading to the exclusion of these regions. By introducing polarizers, we can physically reduce the impact of specular reflection and effectively capture fringes in shiny regions.
- (3)
- Multi-scale convolutional neural network to enhance fringe quality. This approach works synergistically with the polarizer-based solution. While polarizers reduce specular reflections, they also darken the entire scene. Previous neural network-based methods either directly predict fringes in saturated regions or map the saturated phase to the ideal phase. These approaches require the network to infer the fringe or phase information in large saturated regions, which becomes difficult when the scene’s dynamic range is wide, resulting in more missing fringe information. In contrast, our method addresses the saturation problem by using polarizers to directly reduce the saturation of fringes and applies a neural network to enhance the accuracy of fringes, especially in dark regions. These dark regions contain object information but are susceptible to noise and step-like effects due to the camera’s intensity resolution limitations. Our method improves the accuracy of object fringes and reduces the impact of dark fringe areas. Previous methods often require estimation and reconstruction for missing information, while our approach focuses on denoising and refining existing information, so it is relatively easy to train the network. By combining physical solutions (polarization) with deep learning, we solve the overexposure problem in fringes, reducing the difficulty of network tasks and allowing the network to focus on noise reduction in dark fringes while maintaining 3D measurement accuracy.
2. Principle
2.1. Dual-Frequency Heterodyne Complementary Decoding Method
2.2. Polarizers Eliminate Specular Reflection
2.3. Multi-Scale Convolutional Neural Network for Enhancing Fringe Quality
3. Experiment
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
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Wei, H.; Li, H.; Li, X.; Wang, S.; Deng, G.; Zhou, S. An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry. Sensors 2025, 25, 1942. https://doi.org/10.3390/s25061942
Wei H, Li H, Li X, Wang S, Deng G, Zhou S. An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry. Sensors. 2025; 25(6):1942. https://doi.org/10.3390/s25061942
Chicago/Turabian StyleWei, Hao, Hongru Li, Xuan Li, Sha Wang, Guoliang Deng, and Shouhuan Zhou. 2025. "An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry" Sensors 25, no. 6: 1942. https://doi.org/10.3390/s25061942
APA StyleWei, H., Li, H., Li, X., Wang, S., Deng, G., & Zhou, S. (2025). An Efficient 3D Measurement Method for Shiny Surfaces Based on Fringe Projection Profilometry. Sensors, 25(6), 1942. https://doi.org/10.3390/s25061942