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Journal: Energies, 2021
Volume: 14
Number: 2906
Article:
Application of High-Frequency Leakage Current Model for Characterizing Failure Modes in Digital Logic Gates
Authors:
by
Zahra Abedi, Sameer Hemmady, Thomas Antonsen, Edl Schamiloglu and Payman Zarkesh-Ha
Link:
https://www.mdpi.com/1996-1073/14/10/2906
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