Effects of Geometric and Crystallographic Factors on the Reliability of Al/Si Vertically Cracked Nanofilm/Substrate Systems
Abstract
:1. Introduction
2. Details of Atomistic Simulations
3. Results and Discussion
3.1. Stress–Strain Curves
3.2. Fracture Mechanisms
3.3. Mechanical Properties
4. Conclusions
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
References
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Al | Si | |||
---|---|---|---|---|
MEAM | Experiment [26] | MEAM | Experiment [27] | |
C11 | 110.81 | 116.3 | 165.63 | 165.64 |
C12 | 61.1 | 64.8 | 63.88 | 63.94 |
C44 | 28.72 | 30.9 | 83.93 | 79.51 |
Length (nm) | Si(010) | Si(110) | Al(010) | Al(110) | |||
---|---|---|---|---|---|---|---|
x | 32.4 | 32.456 | 32.4 | 32.361 | |||
y | 24.3 | 24.438 | y* | y* | |||
z | 1.62 | 1.62 | 1.62 | 1.62 | |||
y* of Al(010) | 2.025 | 3.24 | 4.05 | 5.265 | 6.075 | 7.29 | 8.1 |
y* of Al(110) | 2.005 | 3.15 | 4.009 | 5.155 | 6.014 | 7.159 | 8.019 |
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Shim, J.S.; Go, D.H.; Beom, H.G. Effects of Geometric and Crystallographic Factors on the Reliability of Al/Si Vertically Cracked Nanofilm/Substrate Systems. Materials 2021, 14, 3570. https://doi.org/10.3390/ma14133570
Shim JS, Go DH, Beom HG. Effects of Geometric and Crystallographic Factors on the Reliability of Al/Si Vertically Cracked Nanofilm/Substrate Systems. Materials. 2021; 14(13):3570. https://doi.org/10.3390/ma14133570
Chicago/Turabian StyleShim, Jee S., Dong H. Go, and Hyeon G. Beom. 2021. "Effects of Geometric and Crystallographic Factors on the Reliability of Al/Si Vertically Cracked Nanofilm/Substrate Systems" Materials 14, no. 13: 3570. https://doi.org/10.3390/ma14133570