Seong, D.; Lee, S.Y.; Seo, H.K.; Kim, J.-W.; Park, M.; Yang, M.K.
Highly Reliable Ovonic Threshold Switch with TiN/GeTe/TiN Structure. Materials 2023, 16, 2066.
https://doi.org/10.3390/ma16052066
AMA Style
Seong D, Lee SY, Seo HK, Kim J-W, Park M, Yang MK.
Highly Reliable Ovonic Threshold Switch with TiN/GeTe/TiN Structure. Materials. 2023; 16(5):2066.
https://doi.org/10.3390/ma16052066
Chicago/Turabian Style
Seong, Dongjun, Su Yeon Lee, Hyun Kyu Seo, Jong-Woo Kim, Minsoo Park, and Min Kyu Yang.
2023. "Highly Reliable Ovonic Threshold Switch with TiN/GeTe/TiN Structure" Materials 16, no. 5: 2066.
https://doi.org/10.3390/ma16052066
APA Style
Seong, D., Lee, S. Y., Seo, H. K., Kim, J. -W., Park, M., & Yang, M. K.
(2023). Highly Reliable Ovonic Threshold Switch with TiN/GeTe/TiN Structure. Materials, 16(5), 2066.
https://doi.org/10.3390/ma16052066