The Evaluation of Interface Quality in HfO2 Films Probed by Time-Dependent Second-Harmonic Generation
Abstract
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Zhang, L.; Ye, L.; Zhao, W.; Huang, C.; Liu, X.; Gao, W.; Li, T.; Min, T.; Yang, J.; Tian, M.; et al. The Evaluation of Interface Quality in HfO2 Films Probed by Time-Dependent Second-Harmonic Generation. Materials 2024, 17, 3471. https://doi.org/10.3390/ma17143471
Zhang L, Ye L, Zhao W, Huang C, Liu X, Gao W, Li T, Min T, Yang J, Tian M, et al. The Evaluation of Interface Quality in HfO2 Films Probed by Time-Dependent Second-Harmonic Generation. Materials. 2024; 17(14):3471. https://doi.org/10.3390/ma17143471
Chicago/Turabian StyleZhang, Libo, Li Ye, Weiwei Zhao, Chongji Huang, Xue Liu, Wenshuai Gao, Tao Li, Tai Min, Jinbo Yang, Mingliang Tian, and et al. 2024. "The Evaluation of Interface Quality in HfO2 Films Probed by Time-Dependent Second-Harmonic Generation" Materials 17, no. 14: 3471. https://doi.org/10.3390/ma17143471