Liu, Z.; Zhang, J.; Wang, S.; Geng, F.; Zhang, Q.; Cheng, J.; Chen, M.; Xu, Q.
Ultrafast Process Characterization of Laser-Induced Damage in Fused Silica Using Pump-Probe Shadow Imaging Techniques. Materials 2024, 17, 837.
https://doi.org/10.3390/ma17040837
AMA Style
Liu Z, Zhang J, Wang S, Geng F, Zhang Q, Cheng J, Chen M, Xu Q.
Ultrafast Process Characterization of Laser-Induced Damage in Fused Silica Using Pump-Probe Shadow Imaging Techniques. Materials. 2024; 17(4):837.
https://doi.org/10.3390/ma17040837
Chicago/Turabian Style
Liu, Zhichao, Jian Zhang, Shengfei Wang, Feng Geng, Qinghua Zhang, Jian Cheng, Mingjun Chen, and Qiao Xu.
2024. "Ultrafast Process Characterization of Laser-Induced Damage in Fused Silica Using Pump-Probe Shadow Imaging Techniques" Materials 17, no. 4: 837.
https://doi.org/10.3390/ma17040837
APA Style
Liu, Z., Zhang, J., Wang, S., Geng, F., Zhang, Q., Cheng, J., Chen, M., & Xu, Q.
(2024). Ultrafast Process Characterization of Laser-Induced Damage in Fused Silica Using Pump-Probe Shadow Imaging Techniques. Materials, 17(4), 837.
https://doi.org/10.3390/ma17040837
