Jaud, M.; Passot, S.; Le Bivic, R.; Delacourt, C.; Grandjean, P.; Le Dantec, N.
Assessing the Accuracy of High Resolution Digital Surface Models Computed by PhotoScan® and MicMac® in Sub-Optimal Survey Conditions. Remote Sens. 2016, 8, 465.
https://doi.org/10.3390/rs8060465
AMA Style
Jaud M, Passot S, Le Bivic R, Delacourt C, Grandjean P, Le Dantec N.
Assessing the Accuracy of High Resolution Digital Surface Models Computed by PhotoScan® and MicMac® in Sub-Optimal Survey Conditions. Remote Sensing. 2016; 8(6):465.
https://doi.org/10.3390/rs8060465
Chicago/Turabian Style
Jaud, Marion, Sophie Passot, Réjanne Le Bivic, Christophe Delacourt, Philippe Grandjean, and Nicolas Le Dantec.
2016. "Assessing the Accuracy of High Resolution Digital Surface Models Computed by PhotoScan® and MicMac® in Sub-Optimal Survey Conditions" Remote Sensing 8, no. 6: 465.
https://doi.org/10.3390/rs8060465
APA Style
Jaud, M., Passot, S., Le Bivic, R., Delacourt, C., Grandjean, P., & Le Dantec, N.
(2016). Assessing the Accuracy of High Resolution Digital Surface Models Computed by PhotoScan® and MicMac® in Sub-Optimal Survey Conditions. Remote Sensing, 8(6), 465.
https://doi.org/10.3390/rs8060465