Zhang, H.; Kang, X.; Zheng, Y.; Wei, K.; Wu, H.; Liu, X.; Ye, T.; Jin, Z.
Investigation on Capacitance Collapse Induced by Secondary Capture of Acceptor Traps in AlGaN/GaN Lateral Schottky Barrier Diode. Micromachines 2022, 13, 748.
https://doi.org/10.3390/mi13050748
AMA Style
Zhang H, Kang X, Zheng Y, Wei K, Wu H, Liu X, Ye T, Jin Z.
Investigation on Capacitance Collapse Induced by Secondary Capture of Acceptor Traps in AlGaN/GaN Lateral Schottky Barrier Diode. Micromachines. 2022; 13(5):748.
https://doi.org/10.3390/mi13050748
Chicago/Turabian Style
Zhang, Haitao, Xuanwu Kang, Yingkui Zheng, Ke Wei, Hao Wu, Xinyu Liu, Tianchun Ye, and Zhi Jin.
2022. "Investigation on Capacitance Collapse Induced by Secondary Capture of Acceptor Traps in AlGaN/GaN Lateral Schottky Barrier Diode" Micromachines 13, no. 5: 748.
https://doi.org/10.3390/mi13050748
APA Style
Zhang, H., Kang, X., Zheng, Y., Wei, K., Wu, H., Liu, X., Ye, T., & Jin, Z.
(2022). Investigation on Capacitance Collapse Induced by Secondary Capture of Acceptor Traps in AlGaN/GaN Lateral Schottky Barrier Diode. Micromachines, 13(5), 748.
https://doi.org/10.3390/mi13050748
