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Journal: Micromachines, 2024
Volume: 15
Number: 205

Article: Hot-Carrier Damage in N-Channel EDMOS Used in Single Photon Avalanche Diode Cell through Quasi-Static Modeling
Authors: by Alain Bravaix, Hugo Pitard, Xavier Federspiel and Florian Cacho
Link: https://www.mdpi.com/2072-666X/15/2/205

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