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Journal: Micromachines, 2025
Volume: 16
Number: 514

Article: Research on the Degradation and Failure Mechanisms of the Unclamped-Inductive-Switching Characteristics of p-GaN HEMT Devices
Authors: by Li Liu, Yulu Zhen, Siqiao Li, Bo Pang and Kai Zeng
Link: https://www.mdpi.com/2072-666X/16/5/514

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