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Journal: Crystals, 2025
Volume: 15
Number: 192
192
Article: Recent Developments in Transmission Electron Microscopy for Crystallographic Characterization of Strained Semiconductor Heterostructures
Authors: by Tao Gong, Longqing Chen, Xiaoyi Wang, Yang Qiu, Huiyun Liu, Zixing Yang and Thomas Walther
Link: https://www.mdpi.com/2073-4352/15/2/192

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