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Journal: Appl. Sci., 2020
Volume: 10
Number: 5340
Article:
Inspection and Classification of Semiconductor Wafer Surface Defects Using CNN Deep Learning Networks
Authors:
by
Jong-Chih Chien, Ming-Tao Wu and Jiann-Der Lee
Link:
https://www.mdpi.com/2076-3417/10/15/5340
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