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Journal: Appl. Sci., 2021
Volume: 11
Number: 7498

Article: Cu-Doped TiNxOy Thin Film Resistors DC/RF Performance and Reliability
Authors: by Lev V. Shanidze, Anton S. Tarasov, Mikhail V. Rautskiy, Fyodor V. Zelenov, Stepan O. Konovalov, Ivan V. Nemtsev, Alexander S. Voloshin, Ivan A. Tarasov, Filipp A. Baron and Nikita V. Volkov
Link: https://www.mdpi.com/2076-3417/11/16/7498

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