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Journal: Information, 2024
Volume: 15
Number: 134
Article:
Deep Learning-Based Multiple Droplet Contamination Detector for Vision Systems Using a You Only Look Once Algorithm
Authors:
by
Youngkwang Kim, Woochan Kim, Jungwoo Yoon, Sangkug Chung and Daegeun Kim
Link:
https://www.mdpi.com/2078-2489/15/3/134
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