In Situ Creep Behavior Characterization of Single Crystal Superalloy by UV-DIC at 980 °C
Round 1
Reviewer 1 Report
The article by Shang et al. describes the application of a novel UV-DIC methodology for the analysis of creep behavior of a single crystal Ni alloy and it compares it with the more traditional contact extensometers methodology. The paper is supported by a good number of experimental evidences and the apparatus used for the measurements is described in sufficient detail. The presented data suggest that the UV-DIC methodology might potentially improve the results of the tests on SX at high temperature. Despite that, the description of the results is not well presented and makes it difficult to understand what the authors want to say. I suggest to improve the clarity of the text and try to present the achieved results more clearly. The content of the paper will benefit of a revision of the text (especially the results section).
Author Response
Response to Reviewer 1 Comments
1. The description of the results is not well presented and makes it difficult to understand what the authors want to say. I suggest to improve the clarity of the text and try to present the achieved results more clearly (especially the results section).
We would like to thank you for your time and assistance in reviewing this manuscript and we also appreciated for your valuable comments. Besides, we are glad that hearing the positive evaluation from you on this paper. The part of “Results and discussion” has been carefully checked and the logic of this part has been reconstructed. Due to a mount of modification, some of the "Track Changes" were lost in the manuscript. The “result and discussion” part has been almost overwritten. All the unclear points have been explanation in detail. Meanwhile, we also ask for experienced teacher to help us recover the insufficient on language and style on this article. We believe that the changes to the manuscript as outlined below significantly improve the readability and quality of the paper.
Reviewer 2 Report
The paper Shang et al. entitled: "In-situ creep behavior characterization of single crystal superalloy by UV-DIC at 980 °C" presents the investigation results on the in‐situ characterization of the creep behavior of SX specimens by utilization of UV-DIC system. The system can effectively suppress the strong thermal radiation encountered for the high-temperature observation. The paper is well-organized, however, it should be checked by an English native specialist (Material Engineering). Apart from this issue, the paper can be accepted in the present form. It shows the novelty of the creep behavior characterization of superalloy using UV‐DIC.
Author Response
Response to Reviewer 2 Comments
1. It should be checked by an English native specialist (Material Engineering).
We would like to thank you for your time and assistance in reviewing this manuscript and we also appreciated for your constructive comments. Besides, we are glad that hearing the positive evaluation from you on this paper. The part of “Results and discussion” has been carefully checked and the logic of this part has been reconstructed. Due to a mount of modification, some of the "Track Changes" were lost in the manuscript. The “result and discussion” part has been almost overwritten. All the unclear points have been explanation in detail. Meanwhile, we also ask for an experienced specialist to help us recover the insufficient on language and style on this article. We believe that the changes to the manuscript as outlined below significantly improve the readability and quality of the paper.
Round 2
Reviewer 1 Report
The quality of the manuscript has been improved. I recommend publication in the present form.
