Article Versions Notes

Endo K, Migita S, Ishikawa Y, Matsukawa T, O'uchi S-i, Tsukada J, Mizubayashi W, Morita Y, Ota H, Yamauchi H, et al. Analysis of Threshold Voltage Flexibility in Ultrathin-BOX SOI FinFETs. Journal of Low Power Electronics and Applications. 2014; 4(2):110-118. https://doi.org/10.3390/jlpea4020110

Endo, Kazuhiko, Shinji Migita, Yuki Ishikawa, Takashi Matsukawa, Shin-ichi O'uchi, Junji Tsukada, Wataru Mizubayashi, Yukinori Morita, Hiroyuki Ota, Hitomi Yamauchi, and et al. 2014. "Analysis of Threshold Voltage Flexibility in Ultrathin-BOX SOI FinFETs" Journal of Low Power Electronics and Applications 4, no. 2: 110-118. https://doi.org/10.3390/jlpea4020110

Endo, K., Migita, S., Ishikawa, Y., Matsukawa, T., O'uchi, S. -i., Tsukada, J., Mizubayashi, W., Morita, Y., Ota, H., Yamauchi, H., & Masahara, M. (2014). Analysis of Threshold Voltage Flexibility in Ultrathin-BOX SOI FinFETs. Journal of Low Power Electronics and Applications, 4(2), 110-118. https://doi.org/10.3390/jlpea4020110